A personal view of APL by Iverson K.E.

By Iverson K.E.

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The original image is Fourier-transformed to obtain the power spectrum, in which the periodic patterns of the real-space image are represented by bright spots. One can construct the filtered image by selecting the most pronounced spots of the power spectrum for the reverse Fourier transformation (see Fig. 3). This filtering highlights the periodic features of the image but loses information about the nonperiodic features that might have resulted from local defects. 3 Actual example of FFT filtering for the STM height image of the organic salt a(BEDT-TTF)21Br2(see Chapter 10): (a) unfiltered image; (b) power spectrum with the selected peaks; (c) filtered image.

Under vacuum, under dried gas, or by immersing the tiphample in a liquid medium). References [l] B. Duke, i’hnneling in Solids, F. Seitz, D. ), Academic Press, New York, 1969. [2] (a) J. N. , Academic Press, New York, 1992. (b) Derjaguin B. , Churaev N. , Muller V. , Surface Forces (In Russian), Nauka, Moscow, 1987. [3] G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel, Phys. Rev. Lett. 1982, 49, 57. [4] C. Ciraci, in Scanning Thnneling Microscopy ZZZ, R. -J. ), Springer, Heidelberg, 1993, p. 139. [5] P.

10 (b)) depending upon whether the fast-scanning direction is along or perpendicular to the cantilever beam, respectively. This cantilever twisting gives rise to the differential signal from the horizontal segments of the photodetector (i. , AcD = C - 0,where C and D are the signals from the left and right segments, respectively) (Fig. 10 (a)). The spatial variation of this signal is converted into a lateral force microscopy (LFM) image. On flat surfaces the lateral force is caused by the friction between the tip and the sample, so LFM is also referred to as frictional force microscopy.

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